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Entwicklung eines Röntgenmikroskops für Photonenenergien von 15 keV bis 30 keV

Author: Marschall, Felix
Source: Directory of Open Access Books
Publisher: KIT Scientific Publishing
ISBN: 9783731502630
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In many research areas X-rays are used for analysis. In X-ray full field microscopy a high resolution is achievable independent of the source properties by using imaging lenses. With an objective lens with 100 mm focal length a theoretical resolution of 60nm is achievable at 30 keV. In Experiments a resolution of 200 nm for a field of view of 80 µm